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ALD87 AOI SMT Welding Defect Visual Inspection Instrument
ALD87 AOI SMT Welding Defect Visual Inspection Instrument ALD87 AOI SMT Welding Defect Visual Inspection Instrument

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ALD87 AOI SMT Welding Defect Visual Inspection Instrument

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The ALD87 Series redefines quality assurance in surface-mount technology (SMT) with its advanced 3D imaging and AI-powered analysis. Designed for high-mix PCB production environments, this system delivers unparalleled accuracy in detecting critical soldering and component placement defects that traditional 2D AOI systems often miss.
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3D Height Mapping Technology

  • Multi-angle laser triangulation captures micron-level topography (≤5μm resolution)

  • Detects subtle defects: tombstoning (component lift), coplanarity issues, and solder volume anomalies 

  • Identifies micro-cracks and voiding in BGA/CSP joints through depth-aware analysis

Comprehensive Defect Library

  • Pre-loaded detection algorithms for 50+ defect types including:

    • Bridging (solder shorts) and insufficient solder

    • Solder balls (tin splatter) and cold joints 

    • Component misalignment (≤15μm positional accuracy) 

  • Adaptive learning engine reduces false calls by analyzing thermal stress patterns from soldering profiles 

Smart Process Optimization

  • Real-time SPC dashboards track critical parameters:

    • Solder paste volume consistency (prevents tombstoning/voids) 

    • Component placement drift (detects <0.1° rotational errors)

  • Automated feedback loop with stencil printers/pick-and-place machines

Advanced Package Compatibility

  • Supports emerging 3D packaging technologies:

    • 2.5D/3D IC stacks with TSV interconnects 

    • Hybrid bonding assemblies (≤1μm bump pitch verification) 

  • Validated for ultra-thin die stacks (50μm thickness) in advanced memory modules

Technical Specifications

  • Throughput: 25 panels/hour (standard 450×350mm boards)

  • Lighting: 12-channel programmable multi-spectral illumination

  • Optics: 25MP 4K coaxial imaging + 8-line laser scanner

  • Software: ALD VisionAI 4.0 with deep learning defect classification

Industry-Leading Value

  • Defect Escape Rate: <0.02% @ CPK ≥1.67

  • ROI Accelerator: 40% faster setup vs. conventional 3D AOI

  • Future-Ready: Field-upgradable to support chip-on-wafer and wafer-level packaging inspection

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